High Reliability and Outstanding Performance for Tip enhanced Raman Spectroscopy
Nanoparticles deposition, a propietary technology
NEXT-TIP enhances the performance of AFM tips providing a patented coating of nanoparticles with controlled size and composition and obtaining cutting-edge morphologies from different nano-structures that foster measuring properties.
The nanoparticles deposited at the end of the tips do act as the final probes in microscopy achieving the best lateral resolution and with enhanced lifetime.
Ensured reproducibility fully controlled process
Our technology (physical deposition), by Ion Cluster source, ensures coating purity with no chemical agents, like solvents or adhesives and an accurate morphology.
Next-Tip technology offers multiple configuration choice, allowing different kind of nano-structures in the AFM tip.
Which is very relevant for new developments in tip enhanced Raman spectroscopy (TERS), nano-FTIR, and s-SNOM applications.
Our technology is nowadays protected in: