PRODUCTS

NT-TP-HRES probes allow High-Resolution mapping in topography.

Thanks to the small size of the end of the tip (2 nm), enhanced lateral resolution is achieved (usually the lateral resolution is enhanced by 30%).

Also the Next-Tip probes can be regenerated following our tested procedure that multiplies the lifetime of the tips by a factor of approximately 5 (very convenient for low temperature, high vacuum or any application where the substitution of the tip is not straightforward).

These AFM tips can be used in a wide range of disciplines: including solid-state physics, materials science (polymer chemistry, ceramics, metals…), semiconductor technology, biology, surface chemistry and medicine.

Thanks to the small size of the end of the tip (2 nm), enhanced lateral resolution is achieved (usually the lateral resolution is enhanced by 30%). This mapping resolution is achieved while measuring surface potential.

Also the Next-Tip Probes can be regenerated following our tested procedure that multiplies the lifetime of the tips by a factor of approximately 5 (very convenient for low temperature, high vacuum or any application where the substitution of the tip is not straightforward).

Next-Tip electrically conductive probes have a gold coated tip, that is the best choice for electrical characterization applications such as Kelvin Probe Force Microscopy (KPFM) & Electrical Force Microscopy (EFM).