NANO-IR PROBES PERFORMANCE

The principle of nanoIR spectroscopy is based on a sharp metal-coated tip upon which the excitation laser beam falls.

The electromagnetic field at the tip apex is confined and enhanced due to a combination of localized surface plasmon resonance (LSPR) and lightning rod effects. For this reason, the probe is the main and key element, as it directly influences spatial resolution, reproducibility and enhancement of the signal generated at the sample surface.

Higher nano-FTIR signal

Next-Tip probes provide up to 5x higher IR signal than standard Pt/Ir-coated AFM probes usually employed in nano-FTIR and s-SNOM.

The plot shows a non-normalized near-field amplitude spectra acquired on silicon with both types of probes using the same bandwidth limited laser source.

nano-IR AFM-IR nano-FTIR S-SNOM Scattering SNOM Next-tip near-field amplitude Pt/Ir

Higher nano-FTIR SNR

Spectra acquired with Next-Tip probes present much lower background contribution than those obtained with the standard Pt/Ir-coated tips, leading to a higher signal-to-noise ratio and clearer spectra.

The chart displays 3rd order demodulated nano-FTIR absorption spectra of PMMA recorded in 13.6 seconds with both types of probes.

Higher s-SNOM spatial resolution

The special morphology of Next-Tip probes allows for a higher spatial resolution in s-SNOM images and higher contrast among materials.

This is evinced in the s-SNOM images and profiles shown, where a PMMA layer on silicon is measured with a Next-Tip probe. The s-SNOM images are recorded at 1733 cm-1 where the PMMA has the carbonyl absorption band. Thus, both materials show different reflectivity and absorption at this wavenumber.

The abrupt PMMA edge is measured using a Next-Tip probe and a standard Pt/Ir-coated AFM tip. The former yields a steeper absorption profile along the line marked in the absorption image, and a high SNR, specially on the silicon.

nano spectroscopy SEM apex tip probe nanoparticle
PMMA nano-IR AFM-IR nano-FTIR S-SNOM Scattering SNOM Next-tip near-field phase

Nano-IR PRODUCTS

Elephant trunk-shape

Nano-IR Gold Probes

  • 5 probes box: 945€
  • 10 probes box: 1.795€

If you belong to a research center or university, please, ask for your introductory offer.

NT-IR-E-85

Cantilever main technical data

  • Resonance Frequency: 85 KHz
  • Force Constant: 2.8 N/m
  • Length: 240 µm

Tips Performance

  • Lateral resolution: <5nm
  • Notable lifetime due to the irregularity

 

 

Other technical data

AFM Tip
Shape
Visible
Tip Radius
<5nm
Coating
Gold Nanoparticles
AFM Cantilever
Resonance Frecuency
85 KHz (50 - 130 kHz)
Force constant
2.8 N/m (0.7 - 9 N/m)
Length
240 µm (230 - 250 µm)
Width
35 µm (30 - 40 µm)
Thickness
3 µm (2 - 4 µm)

NT-IR-E-335

Cantilever main technical data

  • Resonance Frequency: 335 KHz
  • Force Constant: 45 N/m
  • Lenght: 160 µm

Tips Performance

  • Lateral resolution: <5nm
  • Notable lifetime due to the irregularity

 

 

Other technical data

AFM Tip
Shape
Visible
Tip Radius
<5nm
Coating
Gold Nanoparticles
AFM Cantilever
Resonance Frecuency
335 KHz (210 - 490 kHz)
Force constant
45 N/m (12- 110N/m)
Length
160 µm (150 - 170 µm)
Width
45 µm (40 - 50 µm)
Thickness
4.6 µm (3.6 – 5.6 µm)

Pyramid Shape

Nano-IR Gold Probes (with alignment grooves)

  • 5 probes box: 945€
  • 10 probes box: 1.795€

If you belong to a research center or university, please, ask for your introductory offer.

NT-IR-P-75

Cantilever main technical data

  • Resonance Frequency: 75 KHz
  • Force Constant: 2.8 N/m
  • Length: 225 µm

Tips Performance

  • Lateral resolution: <5nm
  • Notable lifetime due to the irregularity

 

 

Other technical data

AFM Tip
Shape
Standard
Tip Radius
<5nm
Coating
Gold Nanoparticles
AFM Cantilever
Resonance Frecuency
75 KHz (45 - 115 kHz)
Force constant
2.8 N/m (0.5 - 9.5 N/m)
Length
225 µm (215 - 235 µm)
Width
28 µm (20 - 35 µm)
Thickness
3 µm (2 - 4 µm)

NT-IR-P-330

Cantilever main technical data

  • Resonance Frequency: 330 KHz
  • Force Constant: 42 N/m
  • Lenght: 125 µm

Tips Performance

  • Lateral resolution: <5nm
  • Notable lifetime due to the irregularity

 

 

Other technical data

AFM Tip
Shape
Standard
Tip Radius
<5nm
Coating
Gold Nanoparticles
AFM Cantilever
Resonance Frecuency
330KHz (204 - 497 kHz)
Force constant
42 N/m (10- 130N/m)
Length
125 µm (115 - 135 µm)
Width
30 µm (22.5 - 37.5 µm)
Thickness
4 µm (3 – 5 µm)

Do you want to know it?

high resolution probe TERS Next-tip nanoparticles coating

TERS PROBES

Make your order

    DATA PROTECTION:
    In accordance with data protection regulations, we provide , you with the following processing information:
    Data controller: NEXT TIP S.L
    Purposes of the processing: maintaining a commercial relationship and sending communications of products or services
    Related rights: access, rectification, portability, erasure, limitation and objection
    More processing information in the Privacy policy

    I accept the processing of my data for the purpose of sending products or services communications.