PRODUCTS

We offer products for high resolution in topography (NT-TP) and for electric characterization (NT-CD series)

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HIGH RESOLUTION REGENERATIVE TIPS
FOR AFM TAPPING/NON-CONTACT MODE MAPPING IN TOPOGRAPHY

A new patented technology let us to offer cutting edge properties in AFM TIPS. An innovative process coats the tip with nanoparticles of controlled size and chemical composition, that ensures these properties:

  • Au NANOPARTICLES TIP COATING (Silicon tip).
  • TIP RADIOUS: 2 nm (guaranteed < 3nm).
  • REGENERATIVE PROPERTIES that allows multiply lifetime approximately 5 times.

CANTILEVER MAIN TECHNICAL DATA (Nominal)

  • Resonance Frequency: 75 KHz
  • Force Constant: 2.8 N/m
  • Lenght: 225 um


MODE OF USE

MEASURE MODE

non-contact
Non-Contact
tapping
Tapping
MEASURE ENVIROMENT

air
Air
low-temperature
Low Temperature
ultra-high-vacuum
Ultra High Vacuum
DETECTION SIGNAL

topographic
Topographic

PRODUCT DESCRIPTION

NT-TP- HRES Tips allow High-Resolution mapping in topography.

Thanks to the small size of the end of the tip (2 Nm), enhanced lateral resolution is achieved (usually the lateral resolution is enhanced by 30%).

Also the Next-Tip Probes can be regenerated following our tested procedure that multiplies the lifetime of the tips by a factor of approximately 5 (very convenient for low temperature, high vacuum or any application where the substitution of the tip is not straightforward).

Our AFM chip is standard size, so it is compatible with: Veeco, Bruker, Agilent, Asylum Research, Park Systems, etc.


APPLICATIONS

These AFM tips can be used in a wide range of disciplines: including solid-state physics, materials science (polymer chemistry, ceramics, metals…), semiconductor technology, biology, surface chemistry and medicine.


OTHER TECHNICAL DATA

AFM Tip
Tip Radius 2 nm (<3 guaranteed)
Height 10-15 um
AFM CANTILEVER
Resonance Frequency 75 kHz (45-115 kHz)
ForceConstant 2.8 N/m (0.5-9.5 N/m)
Length 225 um (215-235 um)
Width 28 um (20-35 um)
Thickness 3 um (2-4 um)

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CANTILEVER MAIN TECHNICAL DATA (Nominal)

  • Resonance Frequency: 330 KHz
  • Force Constant: 42 N/m
  • Lenght: 125 um


MODE OF USE

MEASURE MODE

non-contact
Non-Contact
tapping
Tapping
MEASURE ENVIROMENT

air
Air
low-temperature
Low Temperature
ultra-high-vacuum
Ultra High Vacuum
DETECTION SIGNAL

topographic
Topographic

PRODUCT DESCRIPTION

NT-TP- HRES Tips allow High-Resolution mapping in topography.

Thanks to the small size of the end of the tip (2 Nm), enhanced lateral resolution is achieved (usually the lateral resolution is enhanced by 30%).

Also the Next-Tip Probes can be regenerated following our tested procedure that multiplies the lifetime of the tips by a factor of approximately 5 (very convenient for low temperature, high vacuum or any application where the substitution of the tip is not straightforward).

Our AFM chip is standard size, so it is compatible with: Veeco, Bruker, Agilent, Asylum Research, Park Systems, etc.


APPLICATIONS

These AFM tips can be used in a wide range of disciplines: including solid-state physics, materials science (polymer chemistry, ceramics, metals…), semiconductor technology, biology, surface chemistry and medicine.


OTHER TECHNICAL DATA

AFM Tip
Tip Radius 2 nm (<3 guaranteed)
Height 10-15 um
AFM CANTILEVER
Resonance Frequency 330 kHz (205-497 kHz)
ForceConstant 42 N/m (10-130 N/m)
Length 125 um (115-135 um)
Width 30 um (22.5-37.5 um)
Thickness 4 um (3-5 um)

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