PRODUCTS

We offer products for high resolution in topography (NT-TP) and for electric characterization (NT-CD series)

logoCONDUCTIVE REGENERATIVE TIPS

A new patented technology let us to offer cutting edge properties in Conductive AFM TIPS. An innovative process coats the tip with nanoparticles of controlled size and chemical composition, for ultimate resolution higher contrast in the surface potential.

  • Au NANOPARTICLES TIP COATING (Silicon tip).
  • TIP RADIOUS: HRES- 2 nm (guaranteed < 3nm). HSEN- 4 nm (guaranteed < 5nm).
  • REGENERATIVE PROPERTIES that allows multiply lifetime approximately 5 times.
Next-Tip has developed two product series

NT-CD-HRES-75

For ultimate resolution while measuring surface potential.

NT-CD-HSEN-75

For high resolution with higher contrast in the surface potential.

CANTILEVER MAIN TECHNICAL DATA (Nominal)

  • Resonance Frequency: 75 KHz
  • Force Constant: 2.8 N/m
  • Lenght: 225 um


MODE OF USE

MEASURE MODE

non-contact
Non-Contact
tapping
Tapping
MEASURE ENVIROMENT

air
Air
low-temperature
Low Temperature
ultra-high-vacuum
Ultra High Vacuum
DETECTION SIGNAL

electric
Electrostatic
topographic
Topographic

PRODUCT DESCRIPTION

NT-CD- HRES Tips offer cutting edge properties in Conductive AFM TIPS for High-Resolution electrical characterization. Thanks to the small size of the end of the tip (2 nm), enhanced lateral resolution is achieved (usually the lateral resolution is enhanced by 30%). This mapping resolution is achieved while measuring surface potential.

Also the Next-Tip Probes can be regenerated following our tested procedure that multiplies the lifetime of the tips by a factor of approximately 5 (very convenient for low temperature, high vacuum or any application where the substitution of the tip is not straightforward).

Our AFM chip is standard size, so it is compatible with: Veeco, Bruker, Agilent, Asylum Research, Park Systems, etc.


APPLICATIONS

Next Tip electrically conductive proves have a gold coated tip, that is the best choice for electrical characterization applications such as Kelvin Probe Force Microscopy (KPFM), & Electrical Force Microscopy (EFM).


OTHER TECHNICAL DATA

AFM Tip
Tip Radius 2 nm (<3 guaranteed)
Height 10-15 um
AFM CANTILEVER
Resonance Frequency 75 kHz (45-115 kHz)
ForceConstant 2.8 N/m (0.5-9.5 N/m)
Length 225 um (215-235 um)
Width 28 um (20-35 um)
Thickness 3 um (2-4 um)

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CANTILEVER MAIN TECHNICAL DATA (Nominal)

  • Resonance Frequency: 75 KHz
  • Force Constant: 2.8 N/m
  • Lenght: 225 um


MODE OF USE

MEASURE MODE

non-contact
Non-Contact
tapping
Tapping
MEASURE ENVIROMENT

air
Air
low-temperature
Low Temperature
ultra-high-vacuum
Ultra High Vacuum
DETECTION SIGNAL

electric
Electrostatic
topographic
Topographic

PRODUCT DESCRIPTION

NT-TP- HSEN Tips allow Tips offer cutting edge properties in Conductive AFM TIPS for High-Sensitivity electrical characterization. Thanks to the small size of the end of the tip (4 nm), Next Tip obtain a cutting edge resolution with higher contrast in the surface potential.

Also the Next-Tip Probes can be regenerated following our tested procedure that multiplies the lifetime of the tips by a factor of approximately 5 (very convenient for low temperature, high vacuum or any application where the substitution of the tip is not straightforward).

Our AFM chip is standard size, so it is compatible with: Veeco, Bruker, Agilent, Asylum Research, Park Systems, etc.


APPLICATIONS

Next Tip electrically conductive proves have a gold coated tip, that is the best choice for electrical characterization applications such as Kelvin Probe Force Microscopy (KPFM), & Electrical Force Microscopy (EFM).


OTHER TECHNICAL DATA

AFM Tip
Tip Radius 4 nm; (5 nm guaranteed)
Height 10-15 um
AFM CANTILEVER
Resonance Frequency 75 kHz (45-115 kHz)
ForceConstant 2.8 N/m (0.5-9.5 N/m)
Length 225 um (215-235 um)
Width 28 um (20-35 um)
Thickness 3 um (2-4 um)

SHOP NOW