Outstanding Performance for your nano-FTIR, s-SNOM, AFM-IR and Tip Enhanced Raman Spectroscopy measurements
HIGH RESOLUTION PROBES FOR NANO IR AND TERS
NANO-SPECTROSCOPY TIPS MORPHOLOGY
Next-Tip Ltd. has patented a new morphology of the metal coating on an AFM probe.
Our nanofabrication process is based on the deposition of nanoparticles to create nanostructures.
The control of the deposit of these nanoparticles creates on the tip a new morphology different from those found in the literature. This morphology is characterized by the following features
Apex features
Widening at the apex
The apex of our tips is an irregular nanostructure formed by an aggregate of gold nanoparticles with a shape similar to an ‘artichoke’. This morphology provides enough metal to enhance the LSPR effect.
Sharpness in the tip
The nanostructure formed at the apex, terminated by one nanoparticle, gives extremely high sharpness to the probe (up to 3nm). This nanoparticle provides high lateral resolution and increases the lightning rod effect.
Coating side features
The dense coating of nanoparticles forms a particular morphology by creating branch-like nanostructures along the tip surface, increasing the roughness. This heterogeneity of the coating acts as an effective plasmonic antenna to receive and transmit light at the nanoscale.
We have control over the coating:
- Density of nanoparticles
- Metal: gold, silver, etc.
- Length and thickness of the nanostructures
We can reproduce our coating on different kind of probes: tip’s shape, spring constants, etc.
Elephant trunk-shaped tip
Pyramid-shaped tip
NANO-IR PROBES PERFORMANCE
The principle of nanoIR-Spectroscopy is based on a sharp metal-coated tip upon which the excitation laser beam falls.
The electromagnetic field at the tip apex is confined and enhanced due to a combination of localized surface plasmon resonance (LSPR) and lightning rod effects. For this reason, the probe is the main and key element as it directly influences spatial resolution, reproducibility and enhancement of the signal generated on the sample surface.
Higher nano-FTIR signal
Next-Tip probes provide up to 5x higher IR signal than standard Pt/Ir-coated AFM probes usually employed in nano-FTIR and s-SNOM.
The plot shows the near-field amplitude spectra of silicon acquired with both types of probes using the same bandwidth limited laser source.
Higher nano-FTIR SNR
Spectra acquired with Next-Tip probes present much lower background contribution than those obtained with the standard Pt/Ir-coated tips, leading to a higher signal-to-noise ratio and clearer spectra.
The chart displays 3rd order demodulated nano-FTIR absorption spectra of PMMA recorded in 13.6 seconds with both types of probes.
Higher s-SNOM spatial resolution
The special morphology of Next-Tip probes allows for a higher spatial resolution in s-SNOM images and higher contrast among materials.
This is evinced in the s-SNOM images and profiles shown, where a PMMA layer on silicon is measured with a Next-Tip probe. The s-SNOM images are recorded at 1733 cm-1 where the PMMA has the carbonyl absorption band. Thus, both materials show different reflectivity and absorption at this wavenumber.
The abrupt PMMA edge is measured using a Next-Tip probe and a standard Pt/Ir-coated AFM tip. The former yields a steeper absorption profile along the line marked in the absorption image, and a high SNR, specially on the silicon.
Nano-IR PRODUCTS
Nano-IR GOLD Probes
- 5 box: 1.491€
1.695€
- 10 box: 2.635€ 2
.995€
NT-IR-Au-85 GOLD
Cantilever main technical data
- Resonance Frequency: 85 KHz
- Force Constant: 2.8 N/m
- Lenght: 240 µm
Tips Performance
- Lateral resolution: <5nm
- Notable lifetime due to the irregularity
Other technical data
AFM Tip
Shape
Visible
Tip Radius
<5nm
Coating
Gold Nanoparticles
AFM Cantilever
Resonance Frecuency
85 KHz (50 - 130 kHz)
Force constant
2.8 N/m (0.7 - 9 N/m)
Length
240 µm (230 - 250 µm)
Width
35 µm (30 - 40 µm)
Thickness
3 µm (2 - 4 µm)
NT-IR-Au-335 GOLD
Cantilever main technical data
- Resonance Frequency: 335 KHz
- Force Constant: 45 N/m
- Lenght: 160 µm
Tips Performance
- Lateral resolution: <5nm
- Notable lifetime due to the irregularity
Other technical data
AFM Tip
Shape
Visible
Tip Radius
<5nm
Coating
Gold Nanoparticles
AFM Cantilever
Resonance Frecuency
335 KHz (210 - 490 kHz)
Force constant
45 N/m (12- 110N/m)
Length
160 µm (150 - 170 µm)
Width
45 µm (40 - 50 µm)
Thickness
4.6 µm (3.6 – 5.6 µm)
TIP ENHANCED RAMAN SPECTROSCOPY PERFORMANCE
Outstanding performance of Next-Tip TERS probes are related to their morphological features.
The design of these probes have been developed to match the best AFM performance and the most powerfull RAMAN signal.
High resolution
The great control of the coating process allows high resolution on robust probes with a high degree of reproducibility. In addition, this coating process allows the placement of one or two nanoparticles in the apex of the tip, achieving the high lateral resolution. Measurements show AFM resolution less than 5nm and TERS resolution less than 10nm.
Enhancement factor and contrast
The enhancement factor (EF) value is quoted to quantify the enhancement of the Raman signal by the enhancemend electric field at the tip apex and it is based in contrast value. The contrast value is calculated using the experimental data collected from the near-field scan and the far-field scan at the same spatial location. TERS probe of gold guarante to achive a contrast higher than 20 and silver TERS probe higher than 40. These values lead to an enhancement factor up to 105-106 with Next-tip TERS probes.
Lifetime
The life of silver TERS tips is protected with a second layer of gold nanoparticles on the silver metal, preserving the properties of both metals to enhance the effect of plasmon. This dense gold nanoparticle coating guarantees a thicker layer of metal that significantly improves the durability of this type of probes. In addition, the irregularities formed by the nanoparticles along the tip extend its useful life after being deformed by the Raman laser.
Performance
The great control of the coating process allows high resolution on robust probes with a high degree of reproducibility. In addition, this coating process allows the placement of one or two nanoparticles in the apex of the tip, achieving the high lateral resolution. Measurements show AFM resolution less than 5nm and TERS resolution less than 10nm.
TIP ENHANCED RAMAN SPECTROSCOPY PRODUCTS
GOLD Core TERS Probes
- 5 box: 1.491€
1.695€
- 10 box: 2.635€
2.995€
NT-TERS-Au-85 GOLD. Force Modulation with Real Tip Visibility
Cantilever main technical data
- Resonance Frequency: 85 KHz
- Force Constant: 2.8 N/m
- Lenght: 240 µm
TERS Tips Performance
- Enhancement factor ~ 106
- Lateral resolution in TERS: <5nm
- Contrast ~ 20
- Enhancement proved at 633nm laser excitation
- Based on commercial AFM cantilevers
- Notable lifetime due to the irregularity
Other technical data
AFM Tip
Shape
Visible
Tip Radius
<5nm
Coating
Gold Nanoparticles
AFM Cantilever
Resonance Frecuency
85 KHz (50 - 130 kHz)
Force constant
2.8 N/m (0.7 - 9 N/m)
Length
240 µm (230 - 250 µm)
Width
35 µm (30 - 40 µm)
Thickness
3 µm (2 - 4 µm)
NT-TERS-Au-335 GOLD. Tapping Mode AFM Probe with Real Tip Visibility
Cantilever main technical data
- Resonance Frequency: 335 KHz
- Force Constant: 45 N/m
- Lenght: 160 µm
TERS Tips Performance
- Enhancement factor ~ 106
- Lateral resolution in TERS: <5nm
- Contrast ~ 20
- Enhancement proved at 633nm laser excitation
- Based on commercial AFM cantilevers
- Notable lifetime due to the irregularity
Other technical data
AFM Tip
Shape
Visible
Tip Radius
<5nm
Coating
Gold Nanoparticles
AFM Cantilever
Resonance Frecuency
335 KHz (210 - 490 kHz)
Force constant
45 N/m (12- 110N/m)
Length
160 µm (150 - 170 µm)
Width
45 µm (40 - 50 µm)
Thickness
4.6 µm (3.6 – 5.6 µm)
SILVER Core TERS Probes
- 5 box: 1.667€
1.895€
- 10 box: 2.987€
3.395€
NT-TERS-Ag-85 Silver. Force Modulation with Real Tip Visibility
Cantilever main technical data
- Resonance Frequency: 85 KHz
- Force Constant: 2.8 N/m
- Lenght: 240 µm
TERS Tips Performance
- Enhancement factor ~ 106
- Lateral resolution in TERS: <5nm
- Contrast ~ 40
- Enhancement proved at 633nm laser excitation
- Based on commercial AFM cantilevers
- Notable lifetime due to the irregularity and gold layer
Other technical data
AFM Tip
Shape
Visible
Tip Radius
<5nm
Coating
Silver and Gold Nanoparticles
AFM Cantilever
Resonance Frecuency
85 KHz (50 - 130 kHz)
Force constant
2.8 N/m (0.7 - 9 N/m)
Length
240 µm (230 - 250 µm)
Width
35 µm (30 - 40 µm)
Thickness
3 µm (2 - 4 µm)
NT-TERS-Ag-335 Silver. Tapping Mode AFM Probe with Real Tip Visibility
Cantilever main technical data
- Resonance Frequency: 335 KHz
- Force Constant: 45 N/m
- Lenght: 160 µm
TERS Tips Performance
- Enhancement factor ~ 106
- Lateral resolution in TERS: <5nm
- Contrast ~ 40
- Enhancement proved at 633nm laser excitation
- Based on commercial AFM cantilevers
- Notable lifetime due to the irregularity and gold layer
Other technical data
AFM Tip
Shape
Visible
Tip Radius
<5nm
Coating
Silver and Gold Nanoparticles
AFM Cantilever
Resonance Frecuency
335 KHz (210 - 490 kHz)
Force constant
45 N/m (12 - 110 N/m)
Length
160 µm (150 - 170 µm)
Width
45 µm (40 - 50 µm)
Thickness
4.6 µm (3.6 – 5.6 µm)
